Analysis of the Problem of Radiation-Tolerant Information and Control-Systems Implementation
Keywords:
Control Systems, Radiation Effects, Semiconductor Structures, Integrated Circuit, Element Library, Fault, Soft Error, Recovery, Reliability, Structure, Functional OrganizationAbstract
The problem of radiation tolerance of control systems is analyzed. The analytical survey of radiation effects in semiconductor
structures of digital integrated circuits and radiation hardening methods at the level of the element library is conducted. The necessity of special design efforts for increasing the radiation tolerance at levels of device functional organization and control system structure as well as computing processes organization is shown; the corresponding engineering tasks are set.
Published
2012-04-20
How to Cite
Maximenko, S., Melekhin, V., & Filippov, A. (2012). Analysis of the Problem of Radiation-Tolerant Information and Control-Systems Implementation. Information and Control Systems, (2), 18-25. Retrieved from http://proceedings.spiiras.nw.ru/index.php/ius/article/view/13788
Issue
Section
Information processing and control