Analysis of Reliability of Functional Nodes of Digital VLSI Circuits with Structural Redundancy and Periodic Operational State Recovery
Keywords:
Control Systems, Radiation Effects, Integrated Circuit, Fault, Soft Error, Recovery, Reliability, Model, Structure, Triplication, VoterAbstract
There has been presented an analysis of radiation effects impact on digital electronic devices with structural redundancy at a level of functional nodes of integrated circuits included in information-management systems. There has been suggested a mathematical model which allows estimating reliability of a node presented at the register transfer level with account of cyclicity of computational
processes and periodic information recovery in case of elements faults. The fact has been shown that if cyclic operation of nodes with periodical information backup is arranged significant improvement of reliability factors is reached.